Linearity improvement of UltraScale+ FPGA-based time-to-digital converter

• Published in: Nuclear engineering and technology Vol. 55; no. 2; pp. 484 - 492
• Main Authors: Kim, Jaewon, Jung, Jin Ho, Choi, Yong, Jung, Jiwoong, Lee, Sangwon
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.02.2023; Elsevier; 한국원자력학회
• Subjects: Field-programmable gate array; Histogram uniformization; Multi-chain TDL; Tapped-delay line; Time-to-digital converter; 원자력공학; Field-programmable gate array; Multi-chain TDL; Histogram uniformization; Time-to-digital converter; Tapped-delay line
• ISSN: 1738-5733; 2234-358X
• DOI: 10.1016/j.net.2022.10.010

Time-to-digital converters (TDCs) based on the tapped delay line (TDL) architecture have been widely used in various applications requiring a precise time measurement. However, the poor uniformity of the propagation delays in the TDL implemented on FPGA leads to bubble error and large nonlinearity of the TDC. The purpose of this study was to develop an advanced TDC architecture capable of minimizing the bubble errors and improving the linearity. To remove the bubble errors, the decimated delay line (DDL) architecture was implemented on the UltraScale + FPGA; meanwhile, to improve the linearity of the TDC, a histogram uniformization (HU) and multi-chain TDL (MCT) methods were developed and implemented on the FPGA. The integral nonlinearities (INLs) and differential nonlinearities (DNLs) of the plain TDCs with the ‘HU method’ (HU TDC) and with ‘both HU and MCT methods’ (HU-MCT TDC) were measured and compared to those of the TDC with ‘DDL alone’ (plain TDC). The linearity of HU-MCT TDC were superior to those of the plain TDC and HU TDC. The experiment results indicated that HU-MCT TDC developed in this study was useful for improving the linearity of the TDC, which allowed for high timing resolution to be achieved.