Soft X-ray resonant scattering: an element-specific tool to characterize patterned arrays of nanomagnets

• Published in: IEEE transactions on magnetics Vol. 39; no. 5; pp. 3450 - 3452
• Main Authors: Sanchez-Hanke, C., Castano, F.J., Hao, Y., Hulbert, S.L., Ross, C.A., Smith, H.I., Chi-Chang Kao
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.09.2003; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Applied sciences; Electromagnetic scattering; Electronics; Exact sciences and technology; Laboratories; Magnetic anisotropy; Magnetic resonance; Magnetism; Materials science and technology; Micro- and nanoelectromechanical devices (mems/nems); Particle scattering; Perpendicular magnetic anisotropy; Polarization; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; X-ray diffraction; X-ray scattering; Nanometer scale; soft X-ray magnetic scattering; Magnetization; Soft X ray; Magnet; patterned arrays; Magnetic circular dichroism; X ray scattering; Experimental study; magnetization processes; Microelectromechanical device
• ISSN: 0018-9464; 1941-0069
• DOI: 10.1109/TMAG.2003.816179

The authors have demonstrated the use of soft X-ray resonant scattering as an element-specific tool for characterizing the structure and magnetic properties of a rectangular array of nanomagnets. The periodicity and the size of individual elements of an array of Co dots were determined by measuring the intensities of a large number of diffraction orders and comparing them to model calculations performed within the framework of Fraunhoffer diffraction theory. Element-specific hysteresis loops along both the easy and hard axis of the array were measured by tuning the incident energy to the Co L/sub 3/ absorption edge.