Modeling and characterization of shielded low loss CPWs on 65 nm node silicon
Coplanar waveguides(CPWs)are promising candidates for high quality passive devices in millimeterwave frequency bands.In this paper,CPW transmission lines with and without ground shields have been designed and fabricated on 65 nm CMOS technology.A physical-based model is proposed to describe the freq...
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Published in | Journal of semiconductors Vol. 32; no. 6; pp. 55 - 59 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
IOP Publishing
01.06.2011
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Subjects | |
Online Access | Get full text |
ISSN | 1674-4926 |
DOI | 10.1088/1674-4926/32/6/064009 |
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Summary: | Coplanar waveguides(CPWs)are promising candidates for high quality passive devices in millimeterwave frequency bands.In this paper,CPW transmission lines with and without ground shields have been designed and fabricated on 65 nm CMOS technology.A physical-based model is proposed to describe the frequency-dependent per-unit-length L,C,R and G parameters.Starting with a basic CPW structure,the slow-wave effect and ground-shield influence have been analyzed and incorporated into the general model.The accuracy of the model is confirmed by experimental results. |
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Bibliography: | Coplanar waveguides(CPWs)are promising candidates for high quality passive devices in millimeterwave frequency bands.In this paper,CPW transmission lines with and without ground shields have been designed and fabricated on 65 nm CMOS technology.A physical-based model is proposed to describe the frequency-dependent per-unit-length L,C,R and G parameters.Starting with a basic CPW structure,the slow-wave effect and ground-shield influence have been analyzed and incorporated into the general model.The accuracy of the model is confirmed by experimental results. Wang Hongrui,Yang Dongxu,Zhang Li,Zhang Lei , Yu Zhiping Institute of Microelectronics,Tsinghua University,Beijing 100084,China 11-5781/TN CMOS; CPW; shield; model ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1674-4926 |
DOI: | 10.1088/1674-4926/32/6/064009 |