Chen, Y., & Yuang, M. (1996). A cut-based method for terminal-pair reliability. IEEE transactions on reliability, 45(3), 413-416. https://doi.org/10.1109/24.536994
Chicago Style (17th ed.) CitationChen, Y.G, and M.C Yuang. "A Cut-based Method for Terminal-pair Reliability." IEEE Transactions on Reliability 45, no. 3 (1996): 413-416. https://doi.org/10.1109/24.536994.
MLA (9th ed.) CitationChen, Y.G, and M.C Yuang. "A Cut-based Method for Terminal-pair Reliability." IEEE Transactions on Reliability, vol. 45, no. 3, 1996, pp. 413-416, https://doi.org/10.1109/24.536994.
Warning: These citations may not always be 100% accurate.