A cut-based method for terminal-pair reliability

This paper assesses two categories of partition techniques for computing terminal-pair reliability (path-based and cut-based algorithms) by experimenting on published benchmarks; the criteria are the number of subproblems and the computation time. The cut-based algorithm is superior to the path-base...

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Bibliographic Details
Published inIEEE transactions on reliability Vol. 45; no. 3; pp. 413 - 416
Main Authors Chen, Y.G., Yuang, M.C.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.09.1996
Institute of Electrical and Electronics Engineers
Subjects
Applied sciences
Bioreactors
Boolean algebra
Computer networks
Exact sciences and technology
Operational research and scientific management
Operational research. Management science
Partitioning algorithms
Performance gain
Reliability theory. Replacement problems
Partition
System reliability
Performance
Algorithm
Comparative study
Network
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ISSN0018-9529
DOI10.1109/24.536994

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Summary:This paper assesses two categories of partition techniques for computing terminal-pair reliability (path-based and cut-based algorithms) by experimenting on published benchmarks; the criteria are the number of subproblems and the computation time. The cut-based algorithm is superior to the path-based algorithm with respect to the computation time for most benchmarks. A refinement of the cut-based algorithm (using network reduction) profoundly outperforms the path-based algorithm (with reduction) for all benchmarks.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0018-9529
DOI:10.1109/24.536994