The spectroscopy of traps in single crystals, polymers and deposited thin films by space—charge-limited currents

The reliability of determination of local states in dielectrics and wide-bandgap semiconductors from measurements of steady-state space-charge-limited current-voltage characteristics is discussed and methods of analysis of experimental data are shown. It is demonstrated that the technique, if proper...

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Bibliographic Details
Published inVacuum Vol. 39; no. 1; pp. 7 - 10
Main Authors Sworakowski, Juliusz, Nešp↑rek, Stanislav
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 1989
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ISSN0042-207X
1879-2715
DOI10.1016/0042-207X(89)90084-5

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Summary:The reliability of determination of local states in dielectrics and wide-bandgap semiconductors from measurements of steady-state space-charge-limited current-voltage characteristics is discussed and methods of analysis of experimental data are shown. It is demonstrated that the technique, if properly used, may provide a reliable set of data characterizing local states in semiconducting and dielectric materials.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0042-207X
1879-2715
DOI:10.1016/0042-207X(89)90084-5