An In-situ Transmission X-ray Microscope to Observe the Dewetting Process of Au Thin Films induced by Nanosecond Pulsed Laser Irradiation

We coupled an in-situ transmission X-ray microscope (TXM) with a Nd:YAG pulsed laser with a 532-nm wavelength and a 6-ns pulse width. This system was employed to investigate the photo-induced morphological evolution in Au thin films during shot-by-shot irradiation by a single laser pulse. Based on r...

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Published inJournal of the Korean Physical Society Vol. 75; no. 7; pp. 523 - 527
Main Authors Lee, Su Yong, Choi, Jung Won, Kim, Yoonhee, Noh, Do Young, Kang, Hyon Chol
Format Journal Article
LanguageEnglish
Published Seoul The Korean Physical Society 01.10.2019
Springer Nature B.V
한국물리학회
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ISSN0374-4884
1976-8524
DOI10.3938/jkps.75.523

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Summary:We coupled an in-situ transmission X-ray microscope (TXM) with a Nd:YAG pulsed laser with a 532-nm wavelength and a 6-ns pulse width. This system was employed to investigate the photo-induced morphological evolution in Au thin films during shot-by-shot irradiation by a single laser pulse. Based on results for Au thin films with thicknesses of 10 and 20 nm, we successfully demonstrated the in-situ TXM system to be a powerful tool for imaging the photo-induced transition from metal thin films to metal nanoparticles. We also found that the sequence of steps leading to this transition depended critically on the thickness of the Au films.
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ISSN:0374-4884
1976-8524
DOI:10.3938/jkps.75.523