An In-situ Transmission X-ray Microscope to Observe the Dewetting Process of Au Thin Films induced by Nanosecond Pulsed Laser Irradiation
We coupled an in-situ transmission X-ray microscope (TXM) with a Nd:YAG pulsed laser with a 532-nm wavelength and a 6-ns pulse width. This system was employed to investigate the photo-induced morphological evolution in Au thin films during shot-by-shot irradiation by a single laser pulse. Based on r...
Saved in:
Published in | Journal of the Korean Physical Society Vol. 75; no. 7; pp. 523 - 527 |
---|---|
Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Seoul
The Korean Physical Society
01.10.2019
Springer Nature B.V 한국물리학회 |
Subjects | |
Online Access | Get full text |
ISSN | 0374-4884 1976-8524 |
DOI | 10.3938/jkps.75.523 |
Cover
Summary: | We coupled an
in-situ
transmission X-ray microscope (TXM) with a Nd:YAG pulsed laser with a 532-nm wavelength and a 6-ns pulse width. This system was employed to investigate the photo-induced morphological evolution in Au thin films during shot-by-shot irradiation by a single laser pulse. Based on results for Au thin films with thicknesses of 10 and 20 nm, we successfully demonstrated the
in-situ
TXM system to be a powerful tool for imaging the photo-induced transition from metal thin films to metal nanoparticles. We also found that the sequence of steps leading to this transition depended critically on the thickness of the Au films. |
---|---|
Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
ISSN: | 0374-4884 1976-8524 |
DOI: | 10.3938/jkps.75.523 |