Thermal‐Aware Floorplanning with Min‐cut Die Partition for 3D ICs
Three‐dimensional integrated circuits (3D ICs) implement heterogeneous systems in the same platform by stacking several planar chips vertically with through‐silicon via (TSV) technology. 3D ICs have some advantages, including shorter interconnect lengths, higher integration density, and improved per...
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Published in | ETRI journal Vol. 36; no. 4; pp. 635 - 642 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Electronics and Telecommunications Research Institute (ETRI)
01.08.2014
한국전자통신연구원 |
Subjects | |
Online Access | Get full text |
ISSN | 1225-6463 2233-7326 |
DOI | 10.4218/etrij.14.0113.1204 |
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Summary: | Three‐dimensional integrated circuits (3D ICs) implement heterogeneous systems in the same platform by stacking several planar chips vertically with through‐silicon via (TSV) technology. 3D ICs have some advantages, including shorter interconnect lengths, higher integration density, and improved performance. Thermal‐aware design would enhance the reliability and performance of the interconnects and devices. In this paper, we propose thermal‐aware floorplanning with min‐cut die partitioning for 3D ICs. The proposed min‐cut die partition methodology minimizes the number of connections between partitions based on the min‐cut theorem and minimizes the number of TSVs by considering a complementary set from the set of connections between two partitions when assigning the partitions to dies. Also, thermal‐aware floorplanning methodology ensures a more even power distribution in the dies and reduces the peak temperature of the chip. The simulation results show that the proposed methodologies reduced the number of TSVs and the peak temperature effectively while also reducing the run‐time. |
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Bibliography: | This research was supported by the MSIP (Ministry of Science, ICT & Future Planning), Korea, under the ITRC (Information Technology Research Center) support program supervised by the NIPA (National IT Industry Promotion Agency) (NIPA‐2013‐H0301‐13‐1011). http://etrij.etri.re.kr/etrij/journal/article/article.do?volume=36&issue=4&page=635 G704-001110.2014.36.4.019 |
ISSN: | 1225-6463 2233-7326 |
DOI: | 10.4218/etrij.14.0113.1204 |