吴南健, 曹. 李. 韩. 秦. 冯. 刘. (2014). Process techniques of charge transfer time reduction for high speed CMOS image sensors. Journal of semiconductors, 35(11), 90-97. https://doi.org/10.1088/1674-4926/35/11/114010
Chicago Style (17th ed.) Citation吴南健, 曹中祥 李全良 韩烨 秦琦 冯鹏 刘力源. "Process Techniques of Charge Transfer Time Reduction for High Speed CMOS Image Sensors." Journal of Semiconductors 35, no. 11 (2014): 90-97. https://doi.org/10.1088/1674-4926/35/11/114010.
MLA (9th ed.) Citation吴南健, 曹中祥 李全良 韩烨 秦琦 冯鹏 刘力源. "Process Techniques of Charge Transfer Time Reduction for High Speed CMOS Image Sensors." Journal of Semiconductors, vol. 35, no. 11, 2014, pp. 90-97, https://doi.org/10.1088/1674-4926/35/11/114010.
Warning: These citations may not always be 100% accurate.