New interaction solutions of the Kadomtsev-Petviashvili equation

The residual symmetry relating to the truncated Painlev6 expansion of the Kadomtsev-Petviashvili (KP) equation is nonlocal, which is localized in this paper by introducing multiple new dependent variables. By using the standard Lie group approach, new symmetry reduction solutions for the KP equation...

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Bibliographic Details
Published inChinese physics B Vol. 23; no. 10; pp. 1 - 6
Main Author 刘希启 俞军 任博 杨建荣
Format Journal Article
LanguageEnglish
Published 01.10.2014
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ISSN1674-1056
2058-3834
1741-4199
DOI10.1088/1674-1056/23/10/100201

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Summary:The residual symmetry relating to the truncated Painlev6 expansion of the Kadomtsev-Petviashvili (KP) equation is nonlocal, which is localized in this paper by introducing multiple new dependent variables. By using the standard Lie group approach, new symmetry reduction solutions for the KP equation are obtained based on the general form of Lie point symmetry for the prolonged system. In this way, the interaction solutions between solitons and background waves are obtained, which are hard to find by other traditional methods.
Bibliography:The residual symmetry relating to the truncated Painlev6 expansion of the Kadomtsev-Petviashvili (KP) equation is nonlocal, which is localized in this paper by introducing multiple new dependent variables. By using the standard Lie group approach, new symmetry reduction solutions for the KP equation are obtained based on the general form of Lie point symmetry for the prolonged system. In this way, the interaction solutions between solitons and background waves are obtained, which are hard to find by other traditional methods.
Kadomtsev-Petviashvili equation, localization procedure, residual symmetry, Baicklund transfor-mation, symmetry reduction solution
Liu Xi-Zhong, Yu Jun, Ren Bo, and Yang Jian-Rong{ a) Institute of Nonlinear Science, Shaoxing University, Shaoxing 312000, China b )Department of Physics and Electronics, Shangrao Normal University, Shangrao 334001, China}
11-5639/O4
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SourceType-Scholarly Journals-1
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content type line 23
ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/23/10/100201