Nano-ZnO film preparation at low temperature and the optical indices calculation

• Published in: Optoelectronics letters Vol. 10; no. 3; pp. 216 - 220
• Main Author: 杨爱玲 包西昌 李顺嫔 阳仁强 王婷 王玉金 孙亮
• Format: Journal Article
• Language: English
• Published: Heidelberg Tianjin University of Technology 01.05.2014
• Subjects: Lasers; Optical Devices; Optics; Photonics; Physics; Physics and Astronomy; 低温退火; 光学; 吸收边; 折射率; 正常色散; 纳米ZnO薄膜; 膜制剂; 计算结果; Visible Range; Normal Dispersion; Refractive Index; Imaginary Component; Optical Index
• ISSN: 1673-1905; 1993-5013
• DOI: 10.1007/s11801-014-4034-6

The refractive indices of thin films based on Kramers-Kronig theory are corrected. And the correction theory is used to determine the optical indices of nano-ZnO thin films prepared by low temperature sol-gel method. The calculated results indicate that in the visible （Vis） range, the refractive indices of nano-ZnO thin films exhibit a slight abnormal dispersion, while in the ultraviolet （UV） region, the refractive indices increase with wavelengths increasing （normal dispersion）. But the refractive indices show complex change near the absorption edge. The maximum refractive index （1.95） of nano-ZnO thin films within UV range at low temperature annealing is much lower than that of the films annealed at high temperature. The absorption and refractive indices are closely related to the defects in nano-ZnO thin films.