Index sensing characteristics of the plasmonic sensor based on metal-insulator-metal waveguide-coupled structure

• Published in: Optoelectronics letters Vol. 9; no. 5; pp. 321 - 324
• Main Author: 郭健平 朱家胡 黄旭光
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer Berlin Heidelberg 01.09.2013
• Subjects: Lasers; Optical Devices; Optics; Photonics; Physics; Physics and Astronomy; 传感器; 传感材料; 传感特性; 生物检测; 绝缘体; 耦合结构; 表面等离子体激元; 金属波导; Fano Resonance; Refractive Index; Finite Difference Time Domain; Resonant Wavelength; Perfectly Match Layer
• ISSN: 1673-1905; 1993-5013
• DOI: 10.1007/s11801-013-3081-8

A plasmonic refractive index sensor based on metal-insulator-metal （MIM） waveguide-coupled structure is proposed and demonstrated in this paper. The physical mechanism of the device is deduced, and the finite difference time do- main （FDTD） method is employed to simulate and study its index sensing characteristics. Both analytic and simulated results show that the resonant wavelength of the sensor has a linear relationship with the refractive index of material under sensing. Based on the relationship, the refractive index of the material can be obtained from the detection of the resonant wavelength. The results show that the sensitivity of the sensor can exceed 1600 nm/RIU, and it can be used in chemical and biological detections.