Theoretical study on cross sensitivity of fiber Bragg grating sensor affected by double and triple external variables
In this work, the theoretical model of FBG when it is affected by double external variables (temperature and transverse pressure) and triple external variables (temperature, axial strain and transverse pressure) is deduced, respectively. The simulated results show that the properties of cross sensit...
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| Published in | Optoelectronics letters Vol. 7; no. 5; pp. 358 - 362 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
Heidelberg
Tianjin University of Technology
01.09.2011
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1673-1905 1993-5013 |
| DOI | 10.1007/s11801-011-0178-9 |
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| Summary: | In this work, the theoretical model of FBG when it is affected by double external variables (temperature and transverse pressure) and triple external variables (temperature, axial strain and transverse pressure) is deduced, respectively. The simulated results show that the properties of cross sensitivity would change in a certain regulation with the external effects and fiber parameters. At the same time, some valuable suggestions about how to improve the measurement accuracy are put forward as well. |
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| Bibliography: | 12-1370/TN In this work, the theoretical model of FBG when it is affected by double external variables (temperature and transverse pressure) and triple external variables (temperature, axial strain and transverse pressure) is deduced, respectively. The simulated results show that the properties of cross sensitivity would change in a certain regulation with the external effects and fiber parameters. At the same time, some valuable suggestions about how to improve the measurement accuracy are put forward as well. LUO Bin-bin , ZHAO Ming-fu , WANG Shao-fei , ZHOU Xiao-jun , HUANG De-yi , CAO Xue-mei ( 1. Department of Electronic Engineering, Chongqing University of Technology, Chongqing, 400054, China; 2. School of Optoelectronie Information, University of Electronic Science and Technology of China, Chengdu 610054, China) |
| ISSN: | 1673-1905 1993-5013 |
| DOI: | 10.1007/s11801-011-0178-9 |