Effect of de-trapping on carrier transport process in semi-insulating CdZnTe

The effect of de-trapping on the carrier transport process in the CdZ＇nTe detector is studied by laser beam-induced transient current （LBIC） measurement. Trapping time, de-trapping time, and mobility for electrons are determined directly from transient waveforms under various bias voltages. The resu...

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Published inChinese physics B Vol. 24; no. 6; pp. 511 - 515
Main Author 郭榕榕 介万奇 查钢强 徐亚东 冯涛 王涛 杜卓同
Format Journal Article
LanguageEnglish
Published 01.06.2015
Subjects
Cadmium zinc tellurides
Carrier transport
CdZnTe
Electric potential
Electron mobility
Mathematical analysis
Trapping
Voltage
Waveforms
传输过程
俘获
半绝缘
电场增强
电子迁移率
瞬态电流
载流子
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ISSN1674-1056
2058-3834
1741-4199
DOI10.1088/1674-1056/24/6/067203

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Summary:The effect of de-trapping on the carrier transport process in the CdZ＇nTe detector is studied by laser beam-induced transient current （LBIC） measurement. Trapping time, de-trapping time, and mobility for electrons are determined directly from transient waveforms under various bias voltages. The results suggest that an electric field strengthens the capture and emission effects in trap center, which is associated with field-assisted capture and the Poole-Frenkel effect, respectively. The electron mobility is calculated to be 950 cm2/V-s and the corresponding electron mobility-lifetime product is found to be 1.32 × 10-3 cm2/V by a modified Hecht equation with considering the surface recombination effect. It is concluded that the trapping time and de-trapping time obtained from LBIC measurement provide direct information concerning the transport process.
Bibliography:CdZnTe, LBIC, de-trapping, electron transport process, mobility
The effect of de-trapping on the carrier transport process in the CdZ＇nTe detector is studied by laser beam-induced transient current （LBIC） measurement. Trapping time, de-trapping time, and mobility for electrons are determined directly from transient waveforms under various bias voltages. The results suggest that an electric field strengthens the capture and emission effects in trap center, which is associated with field-assisted capture and the Poole-Frenkel effect, respectively. The electron mobility is calculated to be 950 cm2/V-s and the corresponding electron mobility-lifetime product is found to be 1.32 × 10-3 cm2/V by a modified Hecht equation with considering the surface recombination effect. It is concluded that the trapping time and de-trapping time obtained from LBIC measurement provide direct information concerning the transport process.
Guo Rong-Rong, Jie Wan-Qi, Zha Gang-Qiang, Xu Ya-Dong, Feng Tao, Wang Tao, and Du Zhuo-Tong（ State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi＇an 710072, China）
11-5639/O4
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/24/6/067203