Measuring the local electrical properties of individual vanadium-pentoxide nanowires by using electrostatic force microscopy

• Published in: Journal of the Korean Physical Society Vol. 67; no. 12; pp. 2081 - 2085
• Main Authors: Kim, Deok Hyeon, Kim, Taekyeong
• Format: Journal Article
• Language: English
• Published: Seoul The Korean Physical Society 01.12.2015; 한국물리학회
• Subjects: Mathematical and Computational Physics; Particle and Nuclear Physics; Physics; Physics and Astronomy; Theoretical; 물리학; Vanadium-pentoxide nanowires; Electrostatic force microscopy; Electrical properties; Lift height; Phase shift
• ISSN: 0374-4884; 1976-8524
• DOI: 10.3938/jkps.67.2081

A nanoscale investigation of the local electrical properties of individual vanadium-pentoxide (V 2 O 5 ) nanowires (NWs) deposited on a SiO 2 /p + Si substrate was carried out by using electrostatic force microscopy (EFM) in ambient conditions. We found that the EFM phase shift as an electrostatic response of V 2 O 5 NWs to the biased-tip decreases with the lift height due to the electrostatic force gradient. We also observed that the EFM phase shift of V 2 O 5 NWs shows the quadratic voltage dependence for a biased-tip with a fixed lift height. Furthermore, it is observed that the crossed junctions or bundles of the NWs compared to the single NWs showed higher electrostatic response, resulting in a large phase shift in the EFM measurements. These results suggest that the local electrical properties of V 2 O 5 NW surface can be characterized in the nanoscale range by using EFM.