Genetic algorithm initialized artificial neural network based temperature dependent small‐signal modeling technique for GaN high electron mobility transistors

• Published in: International journal of RF and microwave computer-aided engineering Vol. 31; no. 3
• Main Authors: Jarndal, Anwar, Husain, Saddam, Hashmi, Mohammad
• Format: Journal Article
• Language: English
• Published: Hoboken, USA John Wiley & Sons, Inc 01.03.2021
• Subjects: ANN; Artificial neural networks; cascade MLP; Frequency ranges; Gallium nitrides; GaN‐on‐silicon HEMT; genetic algorithm; Genetic algorithms; High electron mobility transistors; Interpolation; MLP; Modelling; Multilayer perceptrons; Neural networks; Robustness; Semiconductor devices; Silicon devices; small‐signal modeling; Temperature; Temperature dependence; Transistors
• ISSN: 1096-4290; 1099-047X
• DOI: 10.1002/mmce.22542

This paper explores and develops efficient temperature‐dependent small‐signal modeling approaches for GaN high electron mobility transistors (HEMTs). The multilayer perceptron (MLP) architecture and cascaded MLP architecture of artificial neural network are employed to model temperature dependence of 2‐mm GaN‐on‐silicon device. It is identified that both architectures face problem of dependence on initials values of weights and biases. To overcome this issue, the genetic algorithm (GA) is incorporated in both MLP and cascaded MLP architectures. The models are trained on a large set of operating conditions (bias voltages and ambient temperatures) over a frequency range of 0.1 to 20 GHz and then tested for both temperature interpolation and extrapolation cases to assess their accuracy and robustness. An excellent agreement between the measured and the modeled S‐parameters over the entire frequency range demonstrate the quality and robustness of the proposed technique. It is also shown that the cascaded MLP with GA exhibits better performance but with increased complexity.