Multi-Coding ECC Algorithm Based on 3D Charge Trap NAND Flash Hot Region Cell Prediction
In this letter, threshold voltage shift model based on 3D Charge Trap NAND flash channel characteristics is built for analyzing the distribution shift and error source of algorithms at different storage time. Multi-Coding BCH based on Hot Region (MC-HR-BCH) is a scheme consists of 3 algorithms. It o...
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| Published in | IEEE communications letters Vol. 24; no. 2; pp. 244 - 248 |
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| Main Authors | , , , |
| Format | Journal Article |
| Language | English |
| Published |
New York
IEEE
01.02.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN | 1089-7798 1558-2558 |
| DOI | 10.1109/LCOMM.2019.2953034 |
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| Abstract | In this letter, threshold voltage shift model based on 3D Charge Trap NAND flash channel characteristics is built for analyzing the distribution shift and error source of algorithms at different storage time. Multi-Coding BCH based on Hot Region (MC-HR-BCH) is a scheme consists of 3 algorithms. It offers good correction capability (130 to 144 errors per 1276 bytes) based on BCH(n = 9200, k = 8192, t = 72). With the help of MC-HR-BCH, the diversity of data in storage time is well handled. |
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| AbstractList | In this letter, threshold voltage shift model based on 3D Charge Trap NAND flash channel characteristics is built for analyzing the distribution shift and error source of algorithms at different storage time. Multi-Coding BCH based on Hot Region (MC-HR-BCH) is a scheme consists of 3 algorithms. It offers good correction capability (130 to 144 errors per 1276 bytes) based on BCH(n = 9200, k = 8192, t = 72). With the help of MC-HR-BCH, the diversity of data in storage time is well handled. |
| Author | Wang, Qi Huo, Zongliang Li, Qianhui Jiang, Yiyang |
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| Cites_doi | 10.1109/JSSC.2018.2884949 10.1109/ICCD.2017.98 10.1109/HPCA.2015.7056062 10.1109/LCOMM.2018.2814985 10.1587/elex.15.20180921 10.1109/ICCD.2013.6657034 10.1007/978-90-481-9431-5_3 10.1109/ICCD.2012.6378623 10.1109/BigComp.2018.00081 |
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| SubjectTerms | 3D-CT NAND flash Algorithms Coding Data models Degradation Encoding Error analysis Error correction codes hot region cell redistribution Multi-Coding ECC RBER balance Silicon Three dimensional models Three-dimensional displays Threshold voltage threshold voltage shift model |
| Title | Multi-Coding ECC Algorithm Based on 3D Charge Trap NAND Flash Hot Region Cell Prediction |
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