Jiang, Y., Wang, Q., Li, Q., & Huo, Z. (2020). Multi-Coding ECC Algorithm Based on 3D Charge Trap NAND Flash Hot Region Cell Prediction. IEEE communications letters, 24(2), 244-248. https://doi.org/10.1109/LCOMM.2019.2953034
Chicago Style (17th ed.) CitationJiang, Yiyang, Qi Wang, Qianhui Li, and Zongliang Huo. "Multi-Coding ECC Algorithm Based on 3D Charge Trap NAND Flash Hot Region Cell Prediction." IEEE Communications Letters 24, no. 2 (2020): 244-248. https://doi.org/10.1109/LCOMM.2019.2953034.
MLA (9th ed.) CitationJiang, Yiyang, et al. "Multi-Coding ECC Algorithm Based on 3D Charge Trap NAND Flash Hot Region Cell Prediction." IEEE Communications Letters, vol. 24, no. 2, 2020, pp. 244-248, https://doi.org/10.1109/LCOMM.2019.2953034.
Warning: These citations may not always be 100% accurate.