APA (7th ed.) Citation

Kim, S., Jang, S., & Kang, S. (2023). Scan Chain Architecture with Data Duplication for Multiple Scan Cell Fault Diagnosis. IEEE transactions on computer-aided design of integrated circuits and systems, 42(8), 1. https://doi.org/10.1109/TCAD.2022.3224899

Chicago Style (17th ed.) Citation

Kim, Sunghoon, Seokjun Jang, and Sungho Kang. "Scan Chain Architecture with Data Duplication for Multiple Scan Cell Fault Diagnosis." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems 42, no. 8 (2023): 1. https://doi.org/10.1109/TCAD.2022.3224899.

MLA (9th ed.) Citation

Kim, Sunghoon, et al. "Scan Chain Architecture with Data Duplication for Multiple Scan Cell Fault Diagnosis." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, vol. 42, no. 8, 2023, p. 1, https://doi.org/10.1109/TCAD.2022.3224899.