Optical Transfer Function Reconstruction in Incoherent Fourier Ptychography

An optical transfer function （OTF） reconstruction model is first embedded into incoherent Fourier ptychography （IFP）. The leading result is a proposed algorithm that can recover both the super-resolution image and the OTF of an imaging system with unknown aberrations simultaneously. This model overc...

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Bibliographic Details
Published inChinese physics letters Vol. 33; no. 4; pp. 48 - 51
Main Author 谢宗良 亓波 马浩统 任戈 谭玉凤 贺璧 曾恒亮 江川
Format Journal Article
LanguageEnglish
Published 01.04.2016
Subjects
傅里叶
像差特性
光学传递函数
成像系统
数值模拟
超分辨率图像
重建模型
非相干
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ISSN0256-307X
1741-3540
DOI10.1088/0256-307X/33/4/044206

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Summary:An optical transfer function （OTF） reconstruction model is first embedded into incoherent Fourier ptychography （IFP）. The leading result is a proposed algorithm that can recover both the super-resolution image and the OTF of an imaging system with unknown aberrations simultaneously. This model overcomes the difficult problem of OTF estimation that the previous IFP faces. The effectiveness of this algorithm is demonstrated by numerical simulations, and the superior reconstruction is presented. We believe that the reported algorithm can extend the original IFP for more complex conditions and may provide a solution by using structured light for characterization of optical systems＇ aberrations.
Bibliography:11-1959/O4
An optical transfer function （OTF） reconstruction model is first embedded into incoherent Fourier ptychography （IFP）. The leading result is a proposed algorithm that can recover both the super-resolution image and the OTF of an imaging system with unknown aberrations simultaneously. This model overcomes the difficult problem of OTF estimation that the previous IFP faces. The effectiveness of this algorithm is demonstrated by numerical simulations, and the superior reconstruction is presented. We believe that the reported algorithm can extend the original IFP for more complex conditions and may provide a solution by using structured light for characterization of optical systems＇ aberrations.
Zong-Liang Xie, Bo Qi， Hao-Tong Ma, Ge Ren, Yu-Feng Tan, Bi He, Heng-Liang Zeng, Chuan Jiang 1Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209 2Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu 610209 4 College 3 University of Chinese Academy of Sciences, Beijing 100049 of Opto-electric Science and Engineering, National University of Defense Technology, Changsha 410073
ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/33/4/044206