侯明东, 叶. 刘. 王. 刘. 罗. 王. 殷. 姬. 胡. 孙. (2017). Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell. Chinese physics B, 26(8), 536-541. https://doi.org/10.1088/1674-1056/26/8/088501
Chicago Style (17th ed.) Citation侯明东, 叶兵 刘杰 王铁山 刘天奇 罗捷 王斌 殷亚楠 姬庆刚 胡培培 孙友梅. "Impact of Energy Straggle on Proton-induced Single Event Upset Test in a 65-nm SRAM Cell." Chinese Physics B 26, no. 8 (2017): 536-541. https://doi.org/10.1088/1674-1056/26/8/088501.
MLA (9th ed.) Citation侯明东, 叶兵 刘杰 王铁山 刘天奇 罗捷 王斌 殷亚楠 姬庆刚 胡培培 孙友梅. "Impact of Energy Straggle on Proton-induced Single Event Upset Test in a 65-nm SRAM Cell." Chinese Physics B, vol. 26, no. 8, 2017, pp. 536-541, https://doi.org/10.1088/1674-1056/26/8/088501.
Warning: These citations may not always be 100% accurate.