刘彧千, 张. 柴. 刘. 杨. 史. 樊. (2017). Modeling and understanding of the thermal failure induced by high power microwave in CMOS inverter. Chinese physics B, 26(5), 425-430. https://doi.org/10.1088/1674-1056/26/5/058502
Chicago Style (17th ed.) Citation刘彧千, 张宇航 柴常春 刘阳 杨银堂 史春蕾 樊庆扬. "Modeling and Understanding of the Thermal Failure Induced by High Power Microwave in CMOS Inverter." Chinese Physics B 26, no. 5 (2017): 425-430. https://doi.org/10.1088/1674-1056/26/5/058502.
MLA (9th ed.) Citation刘彧千, 张宇航 柴常春 刘阳 杨银堂 史春蕾 樊庆扬. "Modeling and Understanding of the Thermal Failure Induced by High Power Microwave in CMOS Inverter." Chinese Physics B, vol. 26, no. 5, 2017, pp. 425-430, https://doi.org/10.1088/1674-1056/26/5/058502.
Warning: These citations may not always be 100% accurate.