Effect of combined platinum and electron on the temperature dependence of forward voltage in fast recovery diode
The temperature dependences of forward voltage drop（VF） of the fast recovery diodes（FRDs） are remarkably influenced by different lifetime controlled treatments. In this paper the results of an experimental study are presented, which are the lifetime controls of platinum treatment, electron irradiati...
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| Published in | Chinese physics B Vol. 24; no. 12; pp. 431 - 434 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
01.12.2015
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1674-1056 2058-3834 1741-4199 |
| DOI | 10.1088/1674-1056/24/12/126104 |
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| Abstract | The temperature dependences of forward voltage drop（VF） of the fast recovery diodes（FRDs） are remarkably influenced by different lifetime controlled treatments. In this paper the results of an experimental study are presented, which are the lifetime controls of platinum treatment, electron irradiation treatment, and the combined treatment of the above ones.Based on deep level transient spectroscopy（DLTS） measurements, a new level E6（EC-0.376 e V） is found in the combined lifetime treated（CLT） sample, which is different from the levels of the individual platinum and electron irradiation ones. Comparing the tested VFresults of CLT samples with the others, the level E6 is responsible for the degradation of temperature dependence of the forward voltage drop in the FRD. |
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| AbstractList | The temperature dependences of forward voltage drop (V sub(F)) of the fast recovery diodes (FRDs) are remarkably influenced by different lifetime controlled treatments. In this paper the results of an experimental study are presented, which are the lifetime controls of platinum treatment, electron irradiation treatment, and the combined treatment of the above ones. Based on deep level transient spectroscopy (DLTS) measurements, a new level E6 (E sub(C)-0.376 eV) is found in the combined lifetime treated (CLT) sample, which is different from the levels of the individual platinum and electron irradiation ones. Comparing the tested V sub(F) results of CLT samples with the others, the level E6 is responsible for the degradation of temperature dependence of the forward voltage drop in the FRD. The temperature dependences of forward voltage drop（VF） of the fast recovery diodes（FRDs） are remarkably influenced by different lifetime controlled treatments. In this paper the results of an experimental study are presented, which are the lifetime controls of platinum treatment, electron irradiation treatment, and the combined treatment of the above ones.Based on deep level transient spectroscopy（DLTS） measurements, a new level E6（EC-0.376 e V） is found in the combined lifetime treated（CLT） sample, which is different from the levels of the individual platinum and electron irradiation ones. Comparing the tested VFresults of CLT samples with the others, the level E6 is responsible for the degradation of temperature dependence of the forward voltage drop in the FRD. |
| Author | 贾云鹏 赵豹 杨霏 吴郁 周璇 李哲 谭健 |
| AuthorAffiliation | College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China State Grid Smart Electrical Engineering, Beijing 100192, China |
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| Cites_doi | 10.1016/S0026-2692(03)00191-5 10.1016/S0026-2692(03)00194-0 10.1063/1.326331 10.1109/T-ED.1977.18803 10.1016/S0038-1101(01)00321-5 10.1109/T-ED.1977.18884 |
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| Notes | The temperature dependences of forward voltage drop（VF） of the fast recovery diodes（FRDs） are remarkably influenced by different lifetime controlled treatments. In this paper the results of an experimental study are presented, which are the lifetime controls of platinum treatment, electron irradiation treatment, and the combined treatment of the above ones.Based on deep level transient spectroscopy（DLTS） measurements, a new level E6（EC-0.376 e V） is found in the combined lifetime treated（CLT） sample, which is different from the levels of the individual platinum and electron irradiation ones. Comparing the tested VFresults of CLT samples with the others, the level E6 is responsible for the degradation of temperature dependence of the forward voltage drop in the FRD. 11-5639/O4 lifetime,temperature dependence,platinum,electron ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
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| References | 3 4 5 6 Siemieniec R (2) 2001 7 Jia Y P (1) 2006; 27 9 Codreanu C (8) 2000 |
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| Snippet | The temperature dependences of forward voltage drop（VF） of the fast recovery diodes（FRDs） are remarkably influenced by different lifetime controlled... The temperature dependences of forward voltage drop (V sub(F)) of the fast recovery diodes (FRDs) are remarkably influenced by different lifetime controlled... |
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| StartPage | 431 |
| SubjectTerms | Diodes Electric potential Electron irradiation Platinum Recovery Temperature dependence Voltage Voltage drop 快恢复二极管 快速恢复 正向电压 深能级瞬态谱 温度依赖性 电子对 联合治疗 铂 |
| Title | Effect of combined platinum and electron on the temperature dependence of forward voltage in fast recovery diode |
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