Effect of combined platinum and electron on the temperature dependence of forward voltage in fast recovery diode

The temperature dependences of forward voltage drop（VF） of the fast recovery diodes（FRDs） are remarkably influenced by different lifetime controlled treatments. In this paper the results of an experimental study are presented, which are the lifetime controls of platinum treatment, electron irradiati...

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Published inChinese physics B Vol. 24; no. 12; pp. 431 - 434
Main Author 贾云鹏 赵豹 杨霏 吴郁 周璇 李哲 谭健
Format Journal Article
LanguageEnglish
Published 01.12.2015
Subjects
Diodes
Electric potential
Electron irradiation
Platinum
Recovery
Temperature dependence
Voltage
Voltage drop
快恢复二极管
快速恢复
正向电压
深能级瞬态谱
温度依赖性
电子对
联合治疗
铂
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ISSN1674-1056
2058-3834
1741-4199
DOI10.1088/1674-1056/24/12/126104

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Summary:The temperature dependences of forward voltage drop（VF） of the fast recovery diodes（FRDs） are remarkably influenced by different lifetime controlled treatments. In this paper the results of an experimental study are presented, which are the lifetime controls of platinum treatment, electron irradiation treatment, and the combined treatment of the above ones.Based on deep level transient spectroscopy（DLTS） measurements, a new level E6（EC-0.376 e V） is found in the combined lifetime treated（CLT） sample, which is different from the levels of the individual platinum and electron irradiation ones. Comparing the tested VFresults of CLT samples with the others, the level E6 is responsible for the degradation of temperature dependence of the forward voltage drop in the FRD.
Bibliography:The temperature dependences of forward voltage drop（VF） of the fast recovery diodes（FRDs） are remarkably influenced by different lifetime controlled treatments. In this paper the results of an experimental study are presented, which are the lifetime controls of platinum treatment, electron irradiation treatment, and the combined treatment of the above ones.Based on deep level transient spectroscopy（DLTS） measurements, a new level E6（EC-0.376 e V） is found in the combined lifetime treated（CLT） sample, which is different from the levels of the individual platinum and electron irradiation ones. Comparing the tested VFresults of CLT samples with the others, the level E6 is responsible for the degradation of temperature dependence of the forward voltage drop in the FRD.
11-5639/O4
lifetime,temperature dependence,platinum,electron
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/24/12/126104