Evolution of Surface Oxide Film of Typical Aluminum Alloy During Medium-Temperature Brazing Process

• Published in: Transactions of Tianjin University Vol. 20; no. 1; pp. 54 - 59
• Main Author: 程方杰 赵海微 王颖 肖兵 姚俊峰
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer Berlin Heidelberg 01.02.2014
• Subjects: Al2O3; Engineering; Humanities and Social Sciences; Mechanical Engineering; MgAl2O4; multidisciplinary; Science; X射线光电子能谱; 中温; 演变; 表面氧化膜; 钎焊工艺; 铝合金; oxide film; medium-temperature brazing; aluminum alloy; phase structure; X-ray photoelectron spectroscopy
• ISSN: 1006-4982; 1995-8196
• DOI: 10.1007/s12209-014-2236-4

The evolution of the surface oxide film along the depth direction of typical aluminum alloy under medium-temperature brazing was investigated by means of X-ray photoelectron spectroscopy （XPS）. For the alloy with Mg content below 2.0wt%, whether under cold rolling condition or during medium-temperature brazing process, the en-richment of Mg element on the surface was not detected and the oxide film was pure Al2O3. However, the oxide film grew obviously during medium-temperature brazing process, and the thickness was about 80 nm. For the alloy with Mg content above 2.0wt%, under cold rolling condition, the original surface oxide film was pure Al2O3. However, the Mg element was significantly enriched on the outermost surface during medium-temperature brazing process, and MgO-based oxide film mixed with small amount of MgAl2O4 was formed with a thickness of about 130 nm. The alloy-ing elements of Mn and Si were not enriched on the surface neither under cold rolling condition nor during medium-temperature brazing process for all the selected aluminum alloy, and the surface oxide film was similar to that of pure aluminum, which was almost entire Al2O3.