Some Properties of the Output of an Integrator in an Infrared System

An analysis of the output of a running integrator in an infrared scanner model is presented. The sensor is corrupted by thermal noise, generation-recombination noise, photon noise, and modulation noise. Expressions for the signal voltage density spectrum, signal pulse shape, noise power spectrum, an...

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Published inIEEE transactions on aerospace and electronic systems Vol. AES-8; no. 4; pp. 552 - 558
Main Authors Clow, Richard, Hansen, Eldon, McNolty, Frank
Format Journal Article
LanguageEnglish
Published IEEE 01.07.1972
Subjects
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ISSN0018-9251
DOI10.1109/TAES.1972.309559

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Abstract An analysis of the output of a running integrator in an infrared scanner model is presented. The sensor is corrupted by thermal noise, generation-recombination noise, photon noise, and modulation noise. Expressions for the signal voltage density spectrum, signal pulse shape, noise power spectrum, and average noise power at the integrator output are derived. A graphical description of the signal-to-noise ratio (SNR) at the integrator output versus time is included, and a comparison of the integrator SNR with that of a matched filter is provided. Expressions are given for the signal pulse shape and the average noise power when the integration time is subject to small Gaussian errors.
AbstractList An analysis of the output of a running integrator in an infrared scanner model is presented. The sensor is corrupted by thermal noise, generation-recombination noise, photon noise, and modulation noise. Expressions for the signal voltage density spectrum, signal pulse shape, noise power spectrum, and average noise power at the integrator output are derived. A graphical description of the signal-to-noise ratio (SNR) at the integrator output versus time is included, and a comparison of the integrator SNR with that of a matched filter is provided. Expressions are given for the signal pulse shape and the average noise power when the integration time is subject to small Gaussian errors.
Author McNolty, Frank
Hansen, Eldon
Clow, Richard
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  organization: Lockheed Palo Alto Research Lab., Palo Alto, Calif. 94087
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Cites_doi 10.1109/TIT.1960.1057571
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  publication-title: Tables of Integrals Series and Products
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Snippet An analysis of the output of a running integrator in an infrared scanner model is presented. The sensor is corrupted by thermal noise, generation-recombination...
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StartPage 552
SubjectTerms Noise generators
Noise shaping
Optical modulation
Optoelectronic and photonic sensors
Power system modeling
Pulse shaping methods
Shape
Signal to noise ratio
Thermal sensors
Voltage
Title Some Properties of the Output of an Integrator in an Infrared System
URI https://ieeexplore.ieee.org/document/4103000
Volume AES-8
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