Some Properties of the Output of an Integrator in an Infrared System

An analysis of the output of a running integrator in an infrared scanner model is presented. The sensor is corrupted by thermal noise, generation-recombination noise, photon noise, and modulation noise. Expressions for the signal voltage density spectrum, signal pulse shape, noise power spectrum, an...

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Bibliographic Details
Published inIEEE transactions on aerospace and electronic systems Vol. AES-8; no. 4; pp. 552 - 558
Main Authors Clow, Richard, Hansen, Eldon, McNolty, Frank
Format Journal Article
LanguageEnglish
Published IEEE 01.07.1972
Subjects
Noise generators
Noise shaping
Optical modulation
Optoelectronic and photonic sensors
Power system modeling
Pulse shaping methods
Shape
Signal to noise ratio
Thermal sensors
Voltage
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ISSN0018-9251
DOI10.1109/TAES.1972.309559

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Summary:An analysis of the output of a running integrator in an infrared scanner model is presented. The sensor is corrupted by thermal noise, generation-recombination noise, photon noise, and modulation noise. Expressions for the signal voltage density spectrum, signal pulse shape, noise power spectrum, and average noise power at the integrator output are derived. A graphical description of the signal-to-noise ratio (SNR) at the integrator output versus time is included, and a comparison of the integrator SNR with that of a matched filter is provided. Expressions are given for the signal pulse shape and the average noise power when the integration time is subject to small Gaussian errors.
ISSN:0018-9251
DOI:10.1109/TAES.1972.309559