封松林, 刘. 张. 钮. 宋. 闵. 张. 周. 万. 张. 李. (2009). Si2Sb2Te5 phase change material studied by an atomic force microscope nano-tip. Journal of semiconductors, 30(6), 34-37. https://doi.org/10.1088/1674-4926/30/6/063003
Chicago Style (17th ed.) Citation封松林, 刘彦伯 张挺 钮晓鸣 宋志棠 闵国全 张静 周伟民 万永中 张剑平 李小丽. "Si2Sb2Te5 Phase Change Material Studied by an Atomic Force Microscope Nano-tip." Journal of Semiconductors 30, no. 6 (2009): 34-37. https://doi.org/10.1088/1674-4926/30/6/063003.
MLA (9th ed.) Citation封松林, 刘彦伯 张挺 钮晓鸣 宋志棠 闵国全 张静 周伟民 万永中 张剑平 李小丽. "Si2Sb2Te5 Phase Change Material Studied by an Atomic Force Microscope Nano-tip." Journal of Semiconductors, vol. 30, no. 6, 2009, pp. 34-37, https://doi.org/10.1088/1674-4926/30/6/063003.
Warning: These citations may not always be 100% accurate.