Chen, H., Huo, S., Muddassir, M., Lee, H., Liu, Y., Li, J., . . . Navarro-Alarcon, D. (2025). PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components With a Robotic Line Scanner. IEEE transactions on instrumentation and measurement, 74, 1-12. https://doi.org/10.1109/TIM.2025.3552466
Chicago Style (17th ed.) CitationChen, Hongpeng, Shengzeng Huo, Muhammad Muddassir, Hoi-Yin Lee, Yuli Liu, Junxi Li, Anqing Duan, Pai Zheng, and David Navarro-Alarcon. "PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components With a Robotic Line Scanner." IEEE Transactions on Instrumentation and Measurement 74 (2025): 1-12. https://doi.org/10.1109/TIM.2025.3552466.
MLA (9th ed.) CitationChen, Hongpeng, et al. "PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components With a Robotic Line Scanner." IEEE Transactions on Instrumentation and Measurement, vol. 74, 2025, pp. 1-12, https://doi.org/10.1109/TIM.2025.3552466.