Prediction of X-ray fluorescence copper grade using regularized stochastic configuration networks

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Bibliographic Details
Published inInformation sciences Vol. 659; p. 120098
Main Authors Sun, Kai, Zhao, Lei, Tian, Pengxin, Zhao, Jianjun, Wang, Dianhui
Format Journal Article
LanguageEnglish
Published 01.02.2024
Online AccessGet full text
ISSN0020-0255
DOI10.1016/j.ins.2024.120098

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ISSN:0020-0255
DOI:10.1016/j.ins.2024.120098