Ion Photon Emission Microscope for Single Event Effect Testing in CIAE

• Published in: Chinese physics letters Vol. 34; no. 7; pp. 71 - 75
• Main Author: 张艳文 郭刚 刘建成 史淑廷 覃英参 李丽丽 贺林峰
• Format: Journal Article
• Language: English
• Published: 01.06.2017
• Subjects: ZnS薄膜; 光子发射; 单粒子效应; 发光材料; 效应试验; 显微镜; 电荷耦合器件; 离子束
• ISSN: 0256-307X; 1741-3540
• DOI: 10.1088/0256-307X/34/7/073401

Ion photon emission microscopy （IPEM） is a new ion-induced emission microscopy. It employs a broad ion beam with high energy and low fluence rate impinging on a sample. The position of a single ion is detected by an optical system with objective lens, prism, microscope tube and charge coupled device （CCD）. A thin ZnS film doped with Ag ions is used as a luminescent material. Generation efficiency and transmission efficiency of photons in the ZnS（Ag） film created by irradiated Cl ions are calculated. A single Cl ion optical microscopic image is observed by high quantum efficiency CCD. The resolution of a single Cl ion given in this IPEM system is 6μm. Several factors influencing the resolution are discussed. A silicon diode is used to collect the electrical signals caused by the incident ions. Effective and accidental coincidence of optical images and electronic signals are illustrated. A two-dimensional map of single event effect is drawn out according to the data of effective coincidence.