Direct Observation of Melt Convection of Silicon by X-ray Radiography

Natural and Forced convection of molten silicon during Czochralski single crystal growth was directly observed using X-ray radiography and solid tracer method. The tracer, whose density and wettability were adjusted to that of molten silicon, was newly developed. Observed flow of natural convection...

Full description

Saved in:
Bibliographic Details
Published inJOURNAL OF THE FLOW VISUALIZATION SOCIETY OF JAPAN Vol. 8; no. 30; pp. 147 - 150
Main Authors HIBIYA, Taketoshi, WATANABE, Hisao, EGUCHI, Minoru, KAKIMOTO, Koichi
Format Journal Article
LanguageJapanese
Published THE VISUALIZATION SOCIETY OF JAPAN 1988
Online AccessGet full text
ISSN0287-3605
1884-0361
DOI10.3154/jvs1981.8.147

Cover

More Information
Summary:Natural and Forced convection of molten silicon during Czochralski single crystal growth was directly observed using X-ray radiography and solid tracer method. The tracer, whose density and wettability were adjusted to that of molten silicon, was newly developed. Observed flow of natural convection of molten silicon in a crucible was not only steady but also transient, and not axisymmetric but asymmetric.
ISSN:0287-3605
1884-0361
DOI:10.3154/jvs1981.8.147