A Study of \Delta\Sigma -CDS Algorithm for X-Ray CCD Applications

Correlated double sampling (CDS) circuits are essential to processing the X-ray charge-coupled devices (CCDs) that have been used in the modern X-ray astronomical field. For spectroscopy observations, the energy resolution is of decisive importance. In this paper, a comprehensive study of the CDS al...

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Published inIEEE transactions on nuclear science Vol. 66; no. 2; pp. 597 - 608
Main Authors Lu, Bo, Chen, Yong, Zhou, Yumei, Cao, Xiaofei, Wang, Yanchao, Yu, Qian, Wang, Kerou, Yi, Ting, Hong, Zhiliang
Format Journal Article
LanguageEnglish
Published IEEE 01.02.2019
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ISSN0018-9499
1558-1578
DOI10.1109/TNS.2019.2892623

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Summary:Correlated double sampling (CDS) circuits are essential to processing the X-ray charge-coupled devices (CCDs) that have been used in the modern X-ray astronomical field. For spectroscopy observations, the energy resolution is of decisive importance. In this paper, a comprehensive study of the CDS algorithm based on the incremental <inline-formula> <tex-math notation="LaTeX">\Delta \Sigma </tex-math></inline-formula> technique, named <inline-formula> <tex-math notation="LaTeX">\Delta \Sigma </tex-math></inline-formula>-CDS algorithm hereafter, is studied. Theoretical and practical aspects for modulations and demodulations for applications with different pixel rates (PRs) are discussed. The concepts of differential cascade-of-integrator filter and truncated cascaded-integrator-comb filter are extensively investigated from both the time-domain and frequency-domain analyses. The operating principles, prototype design, and experimental results are addressed. As a prototype for 100-kHz PR, a readout integrated circuit (ROIC) is designed. When tested with the target X-ray CCD-CCD236 using a <inline-formula> <tex-math notation="LaTeX">1~\mu </tex-math></inline-formula>Ci 55 Fe radioisotope, the ROIC achieves an energy resolution characterized by the full-width-at-half-maximum as 132.4 ± 2.4 eV at 5.9 keV, which is very close to the 121-eV limit of CCD236.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2019.2892623