Modified March C - Algorithm for Embedded Memory Testing

March algorithms are known for memory testing because March-based tests are all simple and possess good fault coverage hence they are the dominant test algorithms implemented in most modern memory BIST. The proposed march algorithm is modified march c- algorithm which uses concurrent technique. Usin...

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Bibliographic Details
Published inInternational journal of electrical and computer engineering (Malacca, Malacca) Vol. 2; no. 5; pp. 571 - 576
Main Authors Parvathi, Muddapu, Vasantha, N., Parasad, K.Satya
Format Journal Article
LanguageEnglish
Published Yogyakarta IAES Institute of Advanced Engineering and Science 01.10.2012
Subjects
Algorithms
Complexity
Concurrency
Faults
Test times
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ISSN2088-8708
2088-8708
DOI10.11591/ijece.v2i5.1587

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Summary:March algorithms are known for memory testing because March-based tests are all simple and possess good fault coverage hence they are the dominant test algorithms implemented in most modern memory BIST. The proposed march algorithm is modified march c- algorithm which uses concurrent technique. Using this modified march c- algorithm the complexity is reduced to 8n as well as the test time is reduced greatly. Because of concurrency in testing the sequences the test results were observed in less time than the traditional March tests. This technique is applied for a memory of size 256x8 and can be extended to any memory size.
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ISSN:2088-8708
2088-8708
DOI:10.11591/ijece.v2i5.1587