Evaluation of 39 medical implants at 7.0 T
With increased signal to noise ratios, 7.0-T MRI has the potential to contribute unique information regarding anatomy and pathophysiology of a disease. However, concerns for the safety of subjects with metallic medical implants have hindered advancement in this field. The purpose of the present rese...
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Published in | British journal of radiology Vol. 88; no. 1056; p. 20150633 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
England
The British Institute of Radiology
2015
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Subjects | |
Online Access | Get full text |
ISSN | 0007-1285 1748-880X 1748-880X |
DOI | 10.1259/bjr.20150633 |
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Summary: | With increased signal to noise ratios, 7.0-T MRI has the potential to contribute unique information regarding anatomy and pathophysiology of a disease. However, concerns for the safety of subjects with metallic medical implants have hindered advancement in this field. The purpose of the present research was to evaluate the MRI safety for 39 commonly used medical implants at 7.0 T.
Selected metallic implants were tested for magnetic field interactions, radiofrequency-induced heating and artefacts using standardized testing techniques.
5 of the 39 implants tested may be unsafe for subjects undergoing MRI at 7.0 T.
Implants were deemed either "MR Conditional" or "MR Unsafe" for the 7.0-T MRI environment. Further research is needed to expand the existing database categorizing implants that are acceptable for patients referred for MRI examinations at 7.0 T.
Lack of MRI testing for common metallic medical implants limits the translational potential of 7.0-T MRI. For safety reasons, patients with metallic implants are not allowed to undergo a 7.0-T MRI scan, precluding part of the population that can benefit from the detailed resolution of ultra-high-field MRIs. This investigation provides necessary MRI testing of common medical implants at 7.0 T. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 The authors David X Feng, Joseph P McCauley, Fea K Morgan–Curtis and Redoan A Salam contributed equally to this article. |
ISSN: | 0007-1285 1748-880X 1748-880X |
DOI: | 10.1259/bjr.20150633 |