Lind, A. G., Aldridge, H. L., Bomberger, C. C., Hatem, C., Zide, J. M. O., & Jones, K. S. (2015). Annealing Effects on the Electrical Activation of Si Dopants in InGaAs. ECS transactions, 66(7), 23-27. https://doi.org/10.1149/06607.0023ecst
Chicago Style (17th ed.) CitationLind, Aaron Gregg, Henry Lee Aldridge, Cory Carl Bomberger, Chris Hatem, Joshua M. O. Zide, and Kevin Scott Jones. "Annealing Effects on the Electrical Activation of Si Dopants in InGaAs." ECS Transactions 66, no. 7 (2015): 23-27. https://doi.org/10.1149/06607.0023ecst.
MLA (9th ed.) CitationLind, Aaron Gregg, et al. "Annealing Effects on the Electrical Activation of Si Dopants in InGaAs." ECS Transactions, vol. 66, no. 7, 2015, pp. 23-27, https://doi.org/10.1149/06607.0023ecst.
Warning: These citations may not always be 100% accurate.