Effect of ultrathin GeOx interfacial layer formed by thermal oxidation on Al2O3 capped Ge

• Published in: 中国物理B：英文版 no. 4; pp. 482 - 487
• Main Author: 韩乐 王盛凯 张雄 薛百清 吴汪然 赵毅 刘洪刚
• Format: Journal Article
• Language: English
• Published: 01.04.2014
• Subjects: Al2O3; GeO; pMOSFET; 封顶; 热处理过程; 热氧化法; 界面层; 超薄
• ISSN: 1674-1056; 2058-3834
• DOI: 10.1088/1674-1056/23/4/046804

We propose a modified thermal oxidation method in which an Al2O3 capping layer is used as an oxygen blocking layer （OBL） to form an ultrathin GeOx interracial layer, and obtain a superior Al2O3/GeOx/Ge gate stack. The GeOx interfacial layer is formed in oxidation reaction by oxygen passing through the Al2O3 OBL, in which theAl2O3 layer could restrain the oxygen diffusion and suppress the GeO desorption during thermal treatment. The thickness of the GeOx interfacial layer would dramatically decrease as the thickness of Al2O3 OBL increases, which is beneficial to achieving an ultrathin GeOx interfacial layer to satisfy the demand for small equivalent oxide thickness （EOT）. In addition, the thickness of the GeOx interfacial layer has little influence on the passivation effect of the Al2O3/Ge interface. Ge （100） p-channel metal- oxide-semiconductor field-effect transistors （pMOSFETs） using the Al2O3/GeOx/Ge gate stacks exhibit excellent electrical characteristics; that is, a drain current on-off （Ionloft） ratio of above 1 104, a subthreshold slope of - 120 mV/dec, and a peak hole mobility of 265 cm2/V.s are achieved.