Development of SCAR Markers for Korean Wheat Cultivars Identification

• Published in: Plant breeding and biotechnology pp. 224 - 230
• Main Authors: 한손재, 강천식, 김경훈, 신상현, 최인덕, 김학신, 정영근, 이춘기, 이성일, 최지영, 박광근
• Format: Journal Article
• Language: English
• Published: 한국육종학회 30.09.2014
• Subjects: 농학
• ISSN: 2287-9358; 2287-9366
• DOI: 10.9787/PBB.2014.2.3.224

Amplified fragment length polymorphism (AFLP) is a molecular marker technique based on DNA and is extremelyuseful in detection of high polymorphism between closely related genotypes like Korean wheat cultivars. Six sequence characterizedamplified regions (SCARs) have been developed from inter simple sequence repeat (ISSR) analysis which enabled the identificationand differentiation of 13 Korean wheat cultivars from the other cultivars. We used six combinations of primer sets in our AFLP analysisfor developing additional cultivar-specific markers in Korean wheat. Fifty-eight of the AFLP bands were isolated fromEA-ACG/MA-CAC, EA-AGC/MA-CTG and EA-AGG/MA-CTA primer combinations. Of which 40 bands were selected to designSCAR primer pairs for Korean wheat cultivar identification. Three of 58 amplified primer pairs, KWSM006, KWSM007 and JkSP,enabled wheat cultivar identification. Consequently, 23 of 32 Korean wheat cultivars were classified by eight SCAR marker sets. KCI Citation Count: 4