Kawamura, A., & Makino, H. (2024). Effects of Ar Ion Sputtering on Surface of ZnO Polycrystalline Thin Films Measured by XPS. Journal of Surface Analysis, 30(3), 207. https://doi.org/10.1384/jsa.30.207
Chicago Style (17th ed.) CitationKawamura, Ayuto, and Hisao Makino. "Effects of Ar Ion Sputtering on Surface of ZnO Polycrystalline Thin Films Measured by XPS." Journal of Surface Analysis 30, no. 3 (2024): 207. https://doi.org/10.1384/jsa.30.207.
MLA (9th ed.) CitationKawamura, Ayuto, and Hisao Makino. "Effects of Ar Ion Sputtering on Surface of ZnO Polycrystalline Thin Films Measured by XPS." Journal of Surface Analysis, vol. 30, no. 3, 2024, p. 207, https://doi.org/10.1384/jsa.30.207.
Warning: These citations may not always be 100% accurate.