Simultaneous Visualization of Microscopic Conductivity and Deformation in Conductive Elastomers

• Published in: ACS nano Vol. 18; no. 4; pp. 3438 - 3446
• Main Authors: Liang, Xiaobin, Liu, Haonan, Fujinami, So, Ito, Makiko, Nakajima, Ken
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 30.01.2024
• Subjects: atomic force microscope; microscopic conductivity; in situ; conductive elastomers; flexible conductor
• ISSN: 1936-0851; 1936-086X; 1936-086X
• DOI: 10.1021/acsnano.3c10584

Conductive elastomers are promising for a wide range of applications in many fields due to their unique mechanical and electrical properties, and an understanding of the conductive mechanisms of such materials under deformation is crucial. However, revealing the microscopic conduction mechanism of conductive elastomers is a challenge. In this study, we developed a method that combines in situ deformation nanomechanical atomic force microscopy (AFM) and conductive AFM to successfully and simultaneously characterize the microscopic deformation and microscopic electrical conductivity of nanofiller composite conductive elastomers. With this approach, we visualized the conductive network structure of carbon black and carbon nanotube composite conductive elastomers at the nanoscale, tracked their microscopic response under different compressive strains, and revealed the correlation between microscopic and macroscopic electrical properties. This technique is important for understanding the conductive mechanism of conductive elastomers and improving the design of conductive elastomers.