Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

The subjects of x-ray photoelectron spectroscopy and Auger electron spectroscopy are discussed. Literature published on the topics between Oct 1991 and Sep 1993 is featured.

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Bibliographic Details
Published in	Analytical chemistry (Washington) Vol. 66; no. 12; pp. 163 - 185
Main Authors	Turner, Noel H, Schreifels, John A
Format	Journal Article
Language	English
Published	Washington, DC American Chemical Society 15.06.1994
Subjects	Analytical chemistry Atomic, molecular and charged-particle sources and detectors Chemistry Electron Probe Microanalysis - instrumentation Electron Probe Microanalysis - methods Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Scientific imaging Spectrometric and optical methods Spectrometry, X-Ray Emission - instrumentation Spectrometry, X-Ray Emission - methods Spectroscopy X-rays Chemical analysis Analysis method Instrumentation Photoelectron spectrometry Data processing X ray Review Surface analysis Application Auger electron spectrometry
Online Access	Get full text
ISSN	0003-2700 1520-6882
DOI	10.1021/ac00084a008

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Summary:	The subjects of x-ray photoelectron spectroscopy and Auger electron spectroscopy are discussed. Literature published on the topics between Oct 1991 and Sep 1993 is featured.
Bibliography:	ark:/67375/TPS-FT5D1PFJ-5 istex:8E9BAF90FDC1B3A4B290DE29BD2C77DFD4C39820 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 14 ObjectType-Article-2 content type line 23 ObjectType-Article-1 ObjectType-Feature-2 ObjectType-Review-3
ISSN:	0003-2700 1520-6882
DOI:	10.1021/ac00084a008