Turner, N. H., & Schreifels, J. A. (2000). Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy. Analytical chemistry (Washington), 72(12), 99-110. https://doi.org/10.1021/a10000110
Chicago Style (17th ed.) CitationTurner, Noel H., and John A. Schreifels. "Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy." Analytical Chemistry (Washington) 72, no. 12 (2000): 99-110. https://doi.org/10.1021/a10000110.
MLA (9th ed.) CitationTurner, Noel H., and John A. Schreifels. "Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy." Analytical Chemistry (Washington), vol. 72, no. 12, 2000, pp. 99-110, https://doi.org/10.1021/a10000110.
Warning: These citations may not always be 100% accurate.