Lu, Y., Shang, L., Zhou, H., Zhu, H., Yang, F., & Zeng, X. (2009, July 26). Statistical reliability analysis under process variation and aging effects. 2009 46th ACM/IEEE Design Automation Conference, 514-519. https://doi.org/10.1145/1629911.1630044
Chicago Style (17th ed.) CitationLu, Yinghai, Li Shang, Hai Zhou, Hengliang Zhu, Fan Yang, and Xuan Zeng. "Statistical Reliability Analysis Under Process Variation and Aging Effects." 2009 46th ACM/IEEE Design Automation Conference 26 Jul. 2009: 514-519. https://doi.org/10.1145/1629911.1630044.
MLA (9th ed.) CitationLu, Yinghai, et al. "Statistical Reliability Analysis Under Process Variation and Aging Effects." 2009 46th ACM/IEEE Design Automation Conference, 26 Jul. 2009, pp. 514-519, https://doi.org/10.1145/1629911.1630044.