Cross-layer reliability of computing systems

This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. It is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing sy...

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Bibliographic Details
Other Authors: Di Natale, Giorgio (Editor), Gizopoulos, Dimitris (Editor), Di Carlo, Stefano (Editor), Bosio, Alberto (Editor), Canal, Ramon (Editor)
Format: eBook
Language: English
Published: London The Institution of Engineering and Technology 2020
Series: Materials, circuits and devices series ; 57.
Subjects:
Computer architecture.
Stochastic processes.
elektronické knihy
electronic books
ISBN: 1785617982
9781785617980
9781785617973
1785617974
Physical Description: 1 online resource (xi, 315 pages) illustrations

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Table of contents

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001 kn-on1191709900
003 OCoLC
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006 m o d
007 cr cn|||||||||
008 200831t20202020enka ob 000 0 eng d
040 |a YDX  |b eng  |e rda  |e pn  |c YDX  |d EBLCP  |d UKAHL  |d STF  |d OCLCO  |d CUS  |d OCLCO  |d OCLCF  |d CUV  |d N$T  |d OCLCO  |d K6U  |d OCLCQ  |d OCLCO 
020 |a 1785617982  |q electronic bk. 
020 |a 9781785617980  |q (electronic bk.) 
020 |z 9781785617973 
020 |z 1785617974 
035 |a (OCoLC)1191709900  |z (OCoLC)1195440262 
245 0 0 |a Cross-layer reliability of computing systems  |c edited by Giorgio Di Natale, Dimitris Gizopoulos, Stefano Di Carlo, Alberto Bosio and Ramon Canal 
264 1 |a London  |b The Institution of Engineering and Technology  |c 2020 
264 4 |c ©2020 
300 |a 1 online resource (xi, 315 pages)  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a IET materials, circuits and devices series  |v 57 
504 |a Included bibliographical references and index (pages 305-315) 
505 0 |a Technological layer / Antonio Rubio and Ramon Canal -- Design techniques to improve the resilience of computing systems : logic layer / Lorena Anghel and Michael Nicolaidis -- Design techniques to improve the resilience of computing systems : architectural layer / Aviral Shrivastava, Kyoungwoo Lee, Hwisoo So, Jinhyo Jung, and Prudhvi Gali -- Design techniques to improve the resilience of computing systems : software layer / Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Matteo Sonza Reorda, and Josie E. Rodriguez Condia -- Cross-layer resilience / Eric Cheng and Subhasish Mitra -- Physical stress / Fernando Fernandes dos Santos, Fabio Benevenuti, Gennaro Rodrigues, Fernanda Kastensmidt, and Paolo Rech -- Soft error modeling and simulation / Mojtaba Ebrahimi and Mehdi Tahoori -- Microarchitecture-level reliability assessment of multi-core processors / Athanasios Chatzidimitriou and Dimitris Gizopoulos -- Fault injection at the instruction set architecture (ISA) level / Karthik Pattabiraman and Guanpeng Li -- Analytical modeling for crosslayer resiliency / Arijit Biswas -- Stochastic methods / Alessandro Savino, Alessandro Vallero, and Stefano Di Carlo 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. It is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing systems 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Computer architecture. 
650 0 |a Stochastic processes. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Di Natale, Giorgio  |e editor 
700 1 |a Gizopoulos, Dimitris  |e editor 
700 1 |a Di Carlo, Stefano  |e editor 
700 1 |a Bosio, Alberto  |e editor 
700 1 |a Canal, Ramon  |e editor 
776 0 8 |i Print version:  |t Cross-layer reliability of computing systems  |d London Institution of Engineering and Technology, 2020  |z 1785617974  |w (OCoLC)1117551660 
830 0 |a Materials, circuits and devices series ;  |v 57. 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpCLRCS001/cross-layer-reliability?kpromoter=marc  |y Full text 

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