Robust design of microelectronics assemblies against mechanical shock, temperature and moisture

This book discusses how the reliability of packaging components is a prime concern to electronics manufacturers. The text presents a thorough review of this field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques. De...

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Bibliographic Details
Main Authors: Wong, E. -H. (Author), Mai, Y. W., 1946- (Author)
Format: eBook
Language: English
Published: Cambridge, UK : Woodhead Publishing, [2015]
Series: Woodhead Publishing series in electronic and optical materials ; no. 81.
Subjects:
ISBN: 9780857099112
0857099116
1845695283
9781845695286
Physical Description: 1 online resource

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