Technology evolution for silicon nano-electronics : selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electronics 2010, June 3-5, 2010, Tokyo Institute of Technology, Tokyo, Japan

Silicon ultra-large scale integrated circuits (ULSIs) are now faced with various physical limits to further scaling. Therefore, it is very important to establish the fundamental science and technology required to produce nano-scale complementary metal-oxide-semiconductor devices (Nano-CMOS) having h...

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Bibliographic Details
Corporate Author: International Symposium on Technology Evolution for Silicon Nano-Electronics Tokyo Institute of Technology)
Other Authors: Miyazaki, Seiichi., Tabata, Hitoshi.
Format: eBook
Language: English
Published: Stafa-Zurich, Switzerland ; Enfield, N.H. : Trans Tech Publications, ©2011.
Series: Key engineering materials ; v. 470.
Subjects:
ISBN: 9783038134947
3038134945
9781628705164
1628705167
3037850515
9783037850510
9771013982607
Physical Description: 1 online resource (xi, 234 pages) : illustrations

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