An introduction to mixed-signal IC test and measurement

"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...

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Bibliographic Details
Main Author Roberts, Gordon W., 1959-
Other Authors Taenzler, Friedrich, Burns, Mark, 1962-
Format Electronic eBook
LanguageEnglish
Published New York : Oxford University Press, ©2012.
Edition2nd ed.
SeriesOxford series in electrical and computer engineering.
Subjects
Online AccessFull text
ISBN9781613449486
1613449488
9780199796212
0199796211
Physical Description1 online resource (xxv, 836 pages) : illustrations

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