ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California

• Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif., Electronic Device Failure Analysis Society, International Symposium for Testing and Failure Analysis/2011, ASM International
• Format: Electronic eBook
• Language: English
• Published: Materials Park, OH : ASM International, 2011.
• Subjects: Electronics > Materials > Testing > Congresses.; Electronic apparatus and appliances > Testing > Congresses.; elektronické knihy; electronic books
• ISBN: 9781615038503; 1615038507; 9781680155112; 1680155113; 9781615038268; 1615038264; 0615038264
• Physical Description: 1 online resource (xix, 456 pages) : illustrations