Nonlinear transistor model parameter extraction techniques

Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.

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Bibliographic Details
Other Authors: Rudolph, Matthias, 1969-, Fager, Christian., Root, David E.
Format: eBook
Language: English
Published: Cambridge, UK ; New York : Cambridge University Press, 2012.
Series: Cambridge RF and microwave engineering series.
Subjects:
ISBN: 9781139161268
1139161261
9781139014960
113901496X
1139157442
9781139157445
9781139154659
1139154656
9781139159210
1139159216
1283342359
9781283342353
9780521762106
0521762103
Physical Description: 1 online resource (xiv, 352 pages) : illustrations

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Table of contents

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Summary: Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.
Bibliography: Includes bibliographical references and index.
ISBN: 9781139161268
1139161261
9781139014960
113901496X
1139157442
9781139157445
9781139154659
1139154656
9781139159210
1139159216
1283342359
9781283342353
9780521762106
0521762103
Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty